SIMS XVI, 2007, Kanazawa
[SIMS XVI Index]
Applied Surface Science 255(4), 2008

The International Symposium on SIMS and Related Techniques
Based on Ion-Solid Interactions at Seikei University (SISS)
SISS-14 in 2012

Japanese

Scope:
SISS will cover SIMS and related techniques based on ion-solid interactions: fundamentals, instrumentation, and application in various fields, such as semiconductors, industrial materials, biological, medical, and environmental sciences. We will have mainly three sessions: Atom Probe, D-SIMS, and TOF-SIMS.

  Committee:
Chair    Hisayoshi Yurimoto (Hokkaido University)
     Masahiro Kudo (Seikei University)
     Satoka Aoyagi (Shimane University)
     Songsu Cho (Ametek)
     Shunichi Hayashi (Nippon Steel)
     Makishi Ishikawa (Ametek)
     Nobuhiko Kato (Seikei University)
     Manabu Komatsu (Canon)
     Teiichiro Kono (Asahi Kasei)
     Jiro Matsuo (Kyoto University)
     Atsushi Murase (Toyota Central R&D Labs.)
     Masashi Nojima (Tokyo University of Science)
     Retsu Oiwa (Omicron)
     Akio Takano (NTT-AT)
     Mitsuhiro Tomita (Toshiba)

* The chair of SISS was changed from Professor Kudo to Professor Yurimoto.

The previous SIMS symposiums

"SISS13"

The past SIMS symposiums in Japan

Kudo Laboratory at Seikei University

SIMS workshop (USA)

MVA & Chemometrics for TOF-SIMS Users (in Japanese)